A one-class peeling method for multivariate outlier detection with applications in Phase I SPC

Published in Quality and Reliability Engineering International, 2020

Martinez, W.G., Weese, M.L., Jones-Farmer, L.A. (2020). "A one-class peeling method for multivariate outlier detection with applications in Phase I SPC." Quality and Reliabity Engineering International. 36:1272-1295.