Robustness of the One-Class Peeling method to the Gaussian Kernel Bandwidth
Published in Quality and Reliability Engineering International, 2022
Lee, L., Weese, M.L., Martinez, W.G., and Jones-Farmer, L.A. "Robustness of the One-Class Peeling method to the Gaussian Kernel Bandwidth." : Quality and Reliability Engineering International 38(3) 1289-1301.